The low-cycle fatigue induced by thermal cycling is the major concern in the reliability of surface mounted technology (SMT) for electronic packaging; however, dynamic loading effects to solder joint fatigue life have not been thoroughly investigated. In fact, the high-cycling fatigue induced by vibration can also contribute a significant effect. In certain circumstances it can become the dominant failure case when semiconductor devices are used in a vibration environment. In this paper, according to random vibration theory, a random fatigue semi-experimental model of SMT solder joint in random vibration condition is created and a series of vibration fatigue experimental vehicles including PBGA256 assembly were conducted. Compared with random vibration test results, its results are good enough to predict solder joints' fatigue. (c) 2004 Elsevier Ltd. All rights reserved.
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