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Influence of Mg doping on the morphology and optical properties of ZnO films for enhanced H_2 sensing

机译:镁掺杂对增强H_2传感的ZnO薄膜形貌和光学性能的影响

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Highly oriented ZnO and Mg doped ZnO thin films were fabricated on Al_2O_3 substrate by sputtering at room temperature. The effect of Mg doping on the structural, optical, and morphological properties of ZnO film was investigated. The intensity of (002) peak in X-ray diffraction measurements revealed the influence of Mg doping on the crystallinity and orientation of ZnO film. Photoluminescence (PL) results show that the Ultraviolet (UV) emission peak was shifted to lower wavelength side for Mg:ZnO film indicating the possibility for quantum confinement. UV-vis-NIR optical absorption revealed an improvement in optical transmittance from 70 to 85%, and corresponding optical band gap from 3.25 to 3.54 eV. Atomic force microscope (AFM) images revealed the nano-size particulate microstructure of the films. The surface topography of Mg doped ZnO film confirmed decreased grain size with large surface roughness and increased surface area, favorable for sensing. Pure ZnO and Mg doped ZnO film were used as active layer and tested for its sensing performance to hydrogen. Compared to undoped ZnO, 22 at.% Mg doped ZnO film showed much higher sensor response to H_2 at a concentration as low as 200 ppm and at a lower operating temperature of 180°C. A linear sensor response was observed for H_2 concentration in the range of 100-500 ppm.
机译:在室温下通过溅射在Al_2O_3衬底上制备了高取向ZnO和Mg掺杂的ZnO薄膜。研究了镁掺杂对ZnO薄膜结构,光学和形貌特性的影响。 X射线衍射测量的(002)峰强度揭示了Mg掺杂对ZnO膜的结晶度和取向的影响。光致发光(PL)结果表明,Mg:ZnO薄膜的紫外(UV)发射峰移至较低波长侧,表明存在量子限制的可能性。 UV-vis-NIR光学吸收显示出透光率从70提高到85%,相应的光学带隙从3.25提高到3.54 eV。原子力显微镜(AFM)图像显示了薄膜的纳米级颗粒微观结构。掺镁的ZnO薄膜的表面形貌证实晶粒尺寸减小,表面粗糙度大,表面积增加,有利于传感。将纯ZnO和Mg掺杂的ZnO薄膜用作有源层,并测试其对氢的传感性能。与未掺杂的ZnO相比,掺杂浓度为200%的Mg的ZnO膜在低至200 ppm的浓度和180°C的较低工作温度下,对H_2的传感器响应要高得多。观察到H_2浓度在100-500 ppm范围内的线性传感器响应。

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