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首页> 外文期刊>Microscopy and analysis. EMEA >A unique wavelength-dispersive soft X-ray emission spectrometer for electron probe X-ray microanalyzers
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A unique wavelength-dispersive soft X-ray emission spectrometer for electron probe X-ray microanalyzers

机译:独特的用于电子探针X射线微分析仪的波长分散软X射线发射光谱仪

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Wavelength-dispersive spectrometers (WDS) have been around for over 60 years. Their longevity is a testament to their effectiveness at measuring X-rays reproducibly, with high efficiency, and with very high energy spectral resolution. The spectrometers have two main components: (1) an analyzing crystal that diffract X-rays conforming to Bragg's Law (nλ = 2d sinθ; where λ is the wavelength, d is the lattice spacing, and 6 is the incident angle of the X-ray); and (2) a counter that records each diffracted X-ray (Figure 1 A). The analyzing crystal and counter have to be moved synchronously to a new position for each different X-ray wavelength. This changes the incident angle of the X-ray striking the analyzing crystal, diffracting a different X-ray wavelength, and insuring that diffracted X-rays enter the counter. Each analyzing crystal is only able to diffract a certain range of X-ray wavelengths (or energies). Three analyzing crystals (TAP, PET and LIF) are required to diffract the range of X-rays with energies between 0.5 and 14 keV. For lower energy X-rays, layered synthetic microstructures are available. These are constructed of interlayers of high and low atomic number materials on a scale of 6-20 nm. These in turn diffract long-wavelength (low-energy) X-rays, just as the natural crystalline material does for the short-wavelength (high-energy) X-rays. Using layered synthetic microstructures, one can analyze X-rays down to the Be Kα line (~109 eV). Even though wavelength-dispersive spectroscopy has been around for over 60 years, it is still the preferred X-ray analytical system for many, because of its high spectral resolution. For comparison, an energy dispersive spectrometer (EDS) has an energy resolution of around 130 eV (when measured as the FWHM of Mn Kα) as compared to a traditional wavelength-dispersive spectrometer (WDS), which has an energy resolution of around 16 eV, almost an order of magnitude improvement.
机译:波长色散光谱仪(WDS)已有60多年的历史了。它们的寿命证明了其可重复,高效,高能谱测量X射线的有效性。光谱仪具有两个主要成分:(1)衍射符合布拉格定律的X射线的分析晶体(nλ= 2dsinθ;其中λ是波长,d是晶格间距,6是X-的入射角射线); (2)一个计数器,记录每个衍射的X射线(图1A)。对于每个不同的X射线波长,分析晶体和计数器必须同步移动到新位置。这改变了撞击分析晶体的X射线的入射角,衍射了不同的X射线波长,并确保衍射的X射线进入计数器。每个分析晶体只能衍射一定范围的X射线波长(或能量)。需要三个分析晶体(TAP,PET和LIF)以0.5至14 keV的能量衍射X射线的范围。对于较低能量的X射线,可以使用分层的合成微结构。它们是由高和低原子序数材料的中间层构成的,尺寸为6-20 nm。这些反过来又会衍射长波(低能)X射线,就像天然晶体材料对短波(高能)X射线一样。使用分层的合成微结构,可以分析X射线直至BeKα线(〜109 eV)。尽管波长色散光谱法已经存在了60多年,但由于其高光谱分辨率,它仍然是许多人首选的X射线分析系统。为了进行比较,与传统的波长色散光谱仪(WDS)相比,能量色散光谱仪(EDS)的能量分辨率约为130 eV(当以MnKα的FWHM进行测量时)。 ,几乎提高了一个数量级。

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