首页> 外文期刊>Microscopy and microanalysis: The official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada >Metallographic Preparation of Zn-21Al-2Cu Alloy for Analysis by Electron Backscatter Diffraction (EBSD)
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Metallographic Preparation of Zn-21Al-2Cu Alloy for Analysis by Electron Backscatter Diffraction (EBSD)

机译:Zn-21Al-2Cu合金的金相制备,用于电子背散射衍射(EBSD)分析

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摘要

Samples of Zn-21Al-2Cu alloy (Zinalco) that will be heavily deformed were prepared using five different manual mechanical metallographic methods. Samples were analyzed before tensile testing using the orientation imaging microscopy-electron backscatter diffraction (OIM-EBSD) technique. The effect of type and particle size during the final polishing stages for this material were studied in order to identify a method that produces a flat, damage free surface with a roughness of about 50 nm and clean from oxide layers, thereby producing diffraction patterns with high image quality (IQ) and adequate confidence indexes (CI). Our results show that final polishing with alumina and silica, as was previously suggested by other research groups for alloys that are difficult to prepare or alloys with low melting point, are not suitable for manual metallographic preparation of this alloy. Indexes of IQ and CI can be used to evaluate methods of metallographic preparation of samples studied using the OIM-EBSD technique.
机译:使用五种不同的手动机械金相方法准备了将严重变形的Zn-21Al-2Cu合金(Zinalco)样品。在拉伸测试之前,使用取向成像显微镜-电子背散射衍射(OIM-EBSD)技术对样品进行了分析。在此材料的最终抛光阶段,研究了类型和粒度的影响,以便确定一种方法,该方法可产生平坦,无损伤的表面(粗糙度约50 nm)并清除氧化物层,从而产生具有高衍射度的衍射图样。图像质量(IQ)和足够的置信度指标(CI)。我们的结果表明,如其他研究小组先前所建议的那样,用氧化铝和二氧化硅进行的最终抛光不适用于难以制备的合金或低熔点合金,因此不适合手动金相制备。 IQ和CI指数可用于评估使用OIM-EBSD技术研究的样品的金相制备方法。

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