首页> 外文期刊>Microwave and optical technology letters >X-BAND LOW PHASE NOISE IN-PHASE AND OUT-OF-PHASE INJECTION-LOCKED PUSH-PUSH DRO
【24h】

X-BAND LOW PHASE NOISE IN-PHASE AND OUT-OF-PHASE INJECTION-LOCKED PUSH-PUSH DRO

机译:X波段低相位噪声同相和异相注射锁定按推DRO

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

An X-band push-push dielectric resonator (DR) oscillator with injection locking capability has been developed. Two injection locking methods, i.e., the in-phase method and the out-of-phase method, are studied. It is found that the out-of-phase method has wider locking range and much less effects on fundamental suppression than that of the in-phase method. The oscillator generates an output power of 9.5 dBm at 12.4 GHz and has a fundamental suppression of 32.5 dBc. Despite using a high quality (Q) factor DR, wide locking range has been obtained. SiGe HBTs with good flicker noise performance were chosen for low phase noise design. The phase noise values of the free running oscillator are -104.4 dBc/Hz, -120.2 dBc/Hz, and -142.6 dBc/Hz at 10 kHz, 100 kHz, and 1 MHz offsets from the carrier frequency, respectively. The phase noise performance is superior or comparable to the reported designs.
机译:已经开发出具有注入锁定能力的X波段推-推介电谐振器(DR)振荡器。研究了两种注入锁定方法,即同相方法和异相方法。结果发现,与同相方法相比,异相方法具有更宽的锁定范围,并且对基本抑制的影响要小得多。该振荡器在12.4 GHz时产生9.5 dBm的输出功率,并具有32.5 dBc的基本抑制。尽管使用了高质量(Q)因子DR,但仍获得了较宽的锁定范围。选择具有良好闪烁噪声性能的SiGe HBT用于低相位噪声设计。自由运行振荡器的相位噪声值在从载波频率偏移10 kHz,100 kHz和1 MHz时分别为-104.4 dBc / Hz,-120.2 dBc / Hz和-142.6 dBc / Hz。相位噪声性能优于或可与报道的设计相媲美。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号