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Measurement and mechanism of pole tip recession with advanced metal evaporated tape at low tension in a linear tape drive

机译:线性磁带驱动器中低张力的先进金属蒸发磁带的极尖凹陷的测量及其机理。

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摘要

Increased head-to-tape spacing in a magnetic tape drive causes signal loss. Pole tip recession (PTR) is a type of differential wear that occurs with tape heads and increases the effective head-to-tape spacing. The extent and mechanism of PTR that occurs when using metal particle (MP) tape has been examined by various authors and is well documented. To achieve higher recording density, tape manufacturers are developing thin-film tapes, such as advanced metal evaporated (AME) tape, for use in linear tape drives. The structure of AME tape is fundamentally different from MP tape and AME tape must be run at lower tension. The goals of this study are to determine the amount of PTR that occurs and to investigate the mechanism by which PTR proceeds when AME and MP tapes are rubbed against a commercial head in a linear tape drive at low tension. Atomic force microscopy (AFM) was used to measure PTR after interval sliding distances. It is shown that use of AME tape led to lower PTR than use of MP tape, and the probable mechanism of PTR growth is three-body abrasion, with different types of abrasive debris from the two tapes.
机译:磁带驱动器中头到磁带的间距增加会导致信号丢失。磁头尖端凹进(PTR)是一种带头磨损,它会增加磁头到磁带的有效间距,这是一种差异磨损。许多作者已经研究了使用金属颗粒(MP)胶带时发生PTR的程度和机理,并且有据可查。为了实现更高的记录密度,磁带制造商正在开发用于高级磁带蒸发器的薄膜磁带,例如高级金属蒸发(AME)磁带。 AME磁带的结构从根本上不同于MP磁带,并且AME磁带必须在较低的张力下运行。这项研究的目的是确定发生的PTR量,并研究在低张力下将AME和MP磁带与线性磁带驱动器中的商用磁头摩擦时PTR进行的机理。在间隔滑动距离后,使用原子力显微镜(AFM)测量PTR。结果表明,使用AME胶带导致的PTR低于使用MP胶带,并且PTR增长的可能机理是三体磨损,两种胶带的磨屑不同。

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