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Evaluation of the effect of different paint cross section preparation methods on the performances of Fourier transformed infrared microscopy in total reflection mode

机译:在全反射模式下评估不同漆面制备方法对傅立叶变换红外显微镜性能的影响

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The stratigraphical characterization of polychrome samples may be considerably limited by sample preparation procedure both in terms of embedding material and surface polishing. Indeed, the use of synthetic embedding media may contaminate the sample, while the surface morphology obtained after polishing may affect the performances of different analytical techniques such as FTIR microscopy both in attenuated total reflection (ATR) and in total reflection mode.In particular, in ATR an optimal contact between the crystal and the sample is necessary, while in total reflection sample roughness affects the shape and the intensities of the spectra.Recently, different sample preparations were studied and compared taking into account the performance of FTIR microscopy in ATR mode but, as this approach presents some disadvantages, such as the risk of damaging the sample due to the pressure of the crystal, the present research work has been focused on total reflection, which works in non-contact mode. Two sample preparation methods based on the use of cyclododecane and KBr, recently proposed for their capability to reduce contamination effects, were selected to evaluate the performances of FTIR microscopy in total reflection mode on samples characterized by a different surface morphology. In particular the sample prepared with epoxy resin and CDD has been subjected to a simple cut, producing an inhomogeneous surface, with a high roughness, while the sample embedded with KBr has been prepared with a fine polishing procedure, obtaining an optically flat surface.Both of the preparation procedures were applied to obtain two paint cross-sections from fragments collected in the same area from a mural temple (15th century) located in Thubeken Lhakhang, Nepal. The cross sections were analysed with FTIR microscopy in total reflection mode, in order to compare the effect of the preparation methods on the spectral response. Line-scan imaging measurements were carried out on both of the samples and the resulting chemical images were re-constructed by a chemometric approach based on principal component analysis.
机译:在包埋材料和表面抛光方面,多色样品的地层特征都可能受到样品制备程序的限制。确实,使用合成包埋介质可能会污染样品,而抛光后获得的表面形态可能会影响诸如FTIR显微镜等不同分析技术在衰减全反射(ATR)和全反射模式下的性能。 ATR必须使晶体与样品之间达到最佳接触,而在全反射时样品粗糙度会影响光谱的形状和强度。最近,研究了不同的样品制备方法,并考虑了FTIR显微镜在ATR模式下的性能,但是由于这种方法存在一些缺点,例如由于晶体压力而损坏样品的风险,因此本研究工作集中在全反射上,该方法在非接触模式下有效。选择了两种基于环十二烷和KBr的样品制备方法,这些方法最近因其具有减少污染影响的能力而被选中,以评估FTIR显微镜在全反射模式下对表征不同表面形态的样品的性能。特别是用环氧树脂和CDD制备的样品经过简单切割,产生了具有高粗糙度的不均匀表面,而嵌入KBr的样品则经过精细抛光程序制备,获得了光学平坦的表面。应用了其中的制备步骤,从位于尼泊尔图本肯拉康(Thubeken Lhakhang)壁画庙宇(15世纪)的同一地区收集的碎片中得到两个油漆横截面。为了比较制备方法对光谱响应的影响,用FTIR显微镜以全反射模式分析了横截面。对两个样品都进行了线扫描成像测量,并通过基于主成分分析的化学计量学方法对所得的化学图像进行了重建。

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