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Measuring the distribution of oxidative damages (OH-groups) by the method of Fourier transform infrared spectroscopy (FTIR) attenuated total reflection (ATR) in thin polypropylene films

机译:用傅里叶变换红外光谱(FTIR)衰减全反射(ATR)方法测量聚丙烯薄膜中的氧化损伤(OH-基)的分布

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Space charges inside the polypropylene film of a high voltage capacitor of the film-foil type changes the homogeneous electrical field. For determining the maximum electrical field stress it is necessary to know the distribution of the space charges depending on the depth of the film. A reason for the build-up of space charges is the existence of oxidative damages by OH-groups to the polypropylene chains where dipole moments can arise and be established. The OH-groups can be detected by Fourier Transform Infrared Spectroscopy (FTIR). A special kind of directing the infrared beam by the method of Attenuated Total Reflection (ATR) allows by changing the angle of incidence a different penetration depth of the beam. In this way an integral value of different film depths can be measured and a distribution of OH-groups can be determined. Measurements are realized on 17,8 /spl mu/m thin polypropylene films used for industrial application in HV film foil power capacitors. For investigations the film is treated by molecular oxygen at increased temperature for some weeks. This treatment accelerates the oxidation which happens under normal conditions on manufacturing, storing and handling polypropylene films. The results of the measurements with FTIR ATR show that the intensity of oxidation (OH-groups) is the highest at the surface layers of the film but it also exists inside of the polypropylene film. So it can be assumed that charges are also established in the volume of thin polypropylene films and not only on their surface. For dimensioning capacitor dielectric it is important to take care of the space charge distribution underneath the surface of polypropylene films.
机译:薄膜箔类型的高压电容器的聚丙烯薄膜内部的空间电荷会改变均匀电场。为了确定最大电场应力,必须根据薄膜的深度知道空间电荷的分布。形成空间电荷的一个原因是OH基对聚丙烯链存在氧化损伤,在聚丙烯链上会出现偶极矩。 OH基团可以通过傅立叶变换红外光谱法(FTIR)检测。一种特殊的通过衰减全反射(ATR)方式引导红外光束的方法是,通过改变入射角来改变光束的不同穿透深度。以此方式,可以测量不同膜深度的积分值,并且可以确定OH基团的分布。可对用于HV薄膜箔功率电容器的工业应用的17,8 / splμm/ m的聚丙烯薄膜进行测量。为了进行研究,将膜在升高的温度下用分子氧处理数周。这种处理加速了在正常条件下在制造,储存和处理聚丙烯薄膜时发生的氧化。 FTIR ATR的测量结果表明,氧化强度(OH-基团)在薄膜表面层最高,但也存在于聚丙烯薄膜内部。因此可以假定,在聚丙烯薄膜的体积中不仅在其表面上也建立了电荷。为了确定电容器电介质的尺寸,重要的是要注意聚丙烯薄膜表面下的空间电荷分布。

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