【24h】

Quantum efficiency of solar-blind semiconductor photodiodes in the far ultraviolet

机译:远紫外光下日盲半导体光电二极管的量子效率

获取原文
获取原文并翻译 | 示例
           

摘要

A difficulty in diverse metrological applications is the measurement of relatively low intensity ultraviolet radiation signals in the presence of an intense visible radiation background. The development of a detector technology that combines the high efficiency and ease of use found in Si photodiodes with the solar-blind characteristics of many photoemissive devices would offer an ideal solution to this problem. Wide bandgap semiconductors (e.g. SiC, GaN and AlGaN) should combine sensitivity comparable to Si photodiodes with solar-blind response. We present ultraviolet quantum efficiency measurements of AlGaN Schottky and GaN p-i-n photodiodes demonstrating responsivity in the far ultraviolet to wavelengths as short as 116 nm (AlGaN Schottky devices) or 180 nm (GaN p-i-n devices) and several orders of magnitude reduction in efficiency for photon energies below the bandgap. The bandgap for GaN corresponds to 365 nm wavelength, and AlGaN devices exhibit cut-off wavelengths as short as 260 nm.
机译:在各种计量学应用中的困难是在强烈的可见辐射背景下测量相对低强度的紫外线辐射信号。将Si光电二极管中的高效率和易用性与许多光电发射器件的日盲特性相结合的检测器技术的发展,将为解决这一问题提供理想的解决方案。宽带隙半导体(例如SiC,GaN和AlGaN)应将可与Si光电二极管媲美的灵敏度与日盲响应结合起来。我们介绍了AlGaN肖特基和GaN引脚光电二极管的紫外量子效率测量结果,证明了在远紫外线对短至116 nm(AlGaN肖特基器件)或180 nm(GaN引脚器件)的波长下的响应度,并且光子能量效率降低了几个数量级。在带隙以下。 GaN的带隙对应于365 nm波长,AlGaN器件的截止波长短至260 nm。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号