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Deposition of aluminum oxide-doped zinc oxide transparent nano-films on glass substrates for electrostatic discharge applications

机译:在玻璃基板上沉积氧化铝掺杂的氧化锌透明纳米膜以用于静电放电应用

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摘要

Aluminum oxide-doped zinc oxide (ZnO:Al_20_3) transparent thin films were deposited by DC magnetron sputtering on glass substrates; film thickness can be correlated with deposition time. The effect of ZnO:Al_20_3 film thickness on electrical properties, ultraviolet (UV) transmission, surface morphology and structure, solvent resistance, and scratch hardness was investigated. The surface roughness and crystallite size of deposited films increased from 0.75 to 2.22 nm and from 14 to 57 nm, respectively, as the film thickness was increased from 18 to 112 nm. In contrast, the percent UV transmission (% T) of ZnO:Al_20_3 deposited glass plates at a wavelength of 365 nm increased when the film thickness was decreased. The electrical properties of nano-film deposited glass plates such as electrical resistance, tribo-charge voltage, and decay time were in the range of electrostatic discharge (ESD) specifications. The ZnO:Al_20_3 nano-film deposited glass substrate possessed good acetone and iso-propanol resistance as well as high scratch hardness. This work opens up the possibility of using the ZnO:Al_20_3 transparent ultra-thin film on glass substrate in ESD applications based on their excellent properties in terms of the relatively thin and adjustable ZnO:Al_20_3 film thickness needed.
机译:通过直流磁控溅射在玻璃基板上沉积氧化铝掺杂的氧化锌(ZnO:Al_20_3)透明薄膜。膜厚度可以与沉积时间相关。研究了ZnO:Al_20_3薄膜厚度对电性能,紫外线(UV)透射率,表面形态和结构,耐溶剂性和耐划痕硬度的影响。随着膜厚度从18nm增加到112nm,沉积膜的表面粗糙度和微晶尺寸分别从0.75nm增加到2.22nm和从14nm增加到57nm。相反,当减小膜厚度时,ZnO:Al_20_3沉积的玻璃板在365 nm波长下的紫外线透射百分比(%T)增大。纳米膜沉积玻璃板的电性能,如电阻,摩擦充电电压和衰减时间均在静电放电(ESD)规格范围内。 ZnO:Al_20_3纳米薄膜沉积玻璃基板具有良好的耐丙酮和异丙醇性能以及较高的耐刮擦性。这项工作为ESD应用提供了在玻璃基板上使用ZnO:Al_20_3透明超薄膜的可能性,这是因为它们具有所需的相对薄且可调节的ZnO:Al_20_3膜厚的优异性能。

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