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首页> 外文期刊>Materials science in semiconductor processing >Vertically-tapered silicon nanowire arrays prepared by plasma enhanced chemical vapor deposition: Synthesis, structural characterization and photoluminescence
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Vertically-tapered silicon nanowire arrays prepared by plasma enhanced chemical vapor deposition: Synthesis, structural characterization and photoluminescence

机译:通过等离子体增强化学气相沉积制备的垂直锥形硅纳米线阵列:合成,结构表征和光致发光

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Vertically aligned silicon nanowires (SiNWs) have been successfully synthesized using pure silane gas as a precursor by very high frequency plasma enhanced chemical vapor deposition (VHF-PECVD) method. The effect of the growth temperature on the morphology, structure and photoluminescence properties of SiNWs has been studied. The SiNWs were needle-liked materials with the length of a few microns having the diameters of tens of nanometers near the bottom and a few nanometers at the top. Thinner nanowires have been obtained at the higher growth temperature process. High resolution transmission electron microscopy confirms that the nanowires are composed of a crystalline silicon core with an oxide shell. The PL spectrum of the Si nanoneedles have shown two emission bands around 450 nm and ~750, which originate from the defects related to oxygen fault in the oxide shell and interfaces between the crystalline Si core and the oxide shell, respectively.
机译:垂直排列的硅纳米线(SiNWs)已通过超高频等离子体增强化学气相沉积(VHF-PECVD)方法使用纯硅烷气体作为前体成功合成。研究了生长温度对SiNWs的形态,结构和光致发光性能的影响。 SiNW是针状材料,其长度为几微米,在底部附近的直径为几十纳米,在顶部顶部的直径为几纳米。在更高的生长温度过程中获得了更细的纳米线。高分辨率透射电子显微镜证实纳米线由具有氧化物壳的结晶硅核组成。 Si纳米针的PL光谱显示出两个发射带,分别在450 nm和〜750 nm左右,分别来自与氧化物壳中的氧缺陷有关的缺陷以及晶体Si核与氧化物壳之间的界面。

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