...
首页> 外文期刊>Materials transactions >Electrical Conductivity Enhancement of PTFE (Teflon) Induced by Homogeneous Low Voltage Electron Beam Irradiation (HLEBI)
【24h】

Electrical Conductivity Enhancement of PTFE (Teflon) Induced by Homogeneous Low Voltage Electron Beam Irradiation (HLEBI)

机译:均相低压电子束辐照(HLEBI)引起的PTFE(Teflon)导电性增强

获取原文
获取原文并翻译 | 示例
           

摘要

Electrical conductivity (σ) enhancement, control, aging stability, and linear relation between σ and reciprocal temperature (1/7) in PTFE (Teflon) had been examined by homogeneous low potential electron beam irradiation (HLEBI). Irradiations up-0.432 MGy were found-raise the σ of PTFE more than two orders of magnitude. In addition, control of electron movement or Fermi level by HLEBI on polymers seems possible since at low HLEBI levels up-0.216 MGy, a strong dependence on σ was observed. Aging stability investigation showed the saturated conductivities at 10~6 s (σ_s) (2.5 x 10~(-19) and 3.6 x 10~(-15) S m~(-1)) obtained at EB doses of 0.0432 and 0.432 MGy, respectively were approximately 4.9 and 70.6 times higher than σ of untreated PTFE (5.1 x 10~(-17)Sm~(-1)). Although the aging initially reduced the σ of irradiated samples, σ_s were remarkably higher than the untreated. For example, the lower dose 0.0432 MGy samples decayed significantly, but its σ_s value (2.5 x 10~(-16) S m~(-1)) was still about 490% above untreated condition at 5.1 x 10~(-17) S m~(-1). ESR (electron spin resonance) measurements showed aging for 10~6 s only slightly reduced the peak intensity of irradiated PTFE. This indicated the charge carriers generated did not easily decay. Results agree with the literature where PTFE was irradiated with VUV and radicals such as CF_3+ did not substantially decay with aging. Since the slopes of linear relationships between logarithmic electrical conductivity (In σ) and reciprocal temperature (1/7) of all PTFE samples irradiated were approximately equal-that before treatment from 303-375 K, HLEBI didn't convert the cr system. The small irradiation dose of 0.0432 MGy raised the electrical conductivity at room temperature. At higher temperatures above ~375 K, the 0.0432 and 0.432 MGy-HLEBI generated drops in conductivity cr. When unstable dangling bonds with isolated radicals at terminated sites are assumed-be formed in irradiated PTFE, the cr recovery by heating-424 K as well as high σ of irradiated PTFE could be explained. HLEBI probably generated dangling bonds in the form of radicals acting as acceptors-carry charge. Since a chemical dopant was not needed-act as a charge carrier, HLEBI could probably be an attractive method-attain homogeneous doping of organic films.
机译:通过均相低电势电子束辐照(HLEBI)检验了PTFE(Teflon)中的电导率(σ)增强,控制,老化稳定性以及σ与相对温度(1/7)之间的线性关系。发现辐照度高达0.432 MGy,将PTFE的σ提高了两个数量级以上。另外,通过在聚合物上的HLEBI水平控制电子运动或费米能级似乎是可能的,因为在低的LEBBI水平高达-0.216 MGy时,观察到对σ的强烈依赖性。老化稳定性研究表明,在EB剂量为0.0432和0.432 MGy的情况下,在10〜6 s(σ_s)(2.5 x 10〜(-19)和3.6 x 10〜(-15)S m〜(-1))下的饱和电导率分别比未处理的PTFE(5.1 x 10〜(-17)Sm〜(-1))的σ分别高4.9和70.6倍。尽管老化最初会降低辐照样品的σ,但σ_s明显高于未处理的样品。例如,较低剂量的0.0432 MGy样品衰减明显,但其σ_s值(2.5 x 10〜(-16)S m〜(-1))仍比未经处理的5.1 x 10〜(-17)约高490%。 S m〜(-1)。 ESR(电子自旋共振)测量表明,老化10〜6 s只会稍微降低辐照PTFE的峰值强度。这表明产生的电荷载流子不容易衰减。结果与文献一致,在文献中,用VUV辐照了PTFE,自由基如CF_3 +基本上不会随老化而衰减。由于所有被辐照的PTFE样品的对数电导率(Inσ)和倒数温度(1/7)之间的线性关系的斜率大约与303-375 K处理之前的斜率相等,因此HLEBI不会转换cr系统。 0.0432 MGy的小辐照剂量提高了室温下的电导率。在高于375 K的较高温度下,0.0432和0.432 MGy-HLEBI产生的电导率cr下降。当假定在辐照的PTFE中形成了带有游离基团的不稳定的悬空键时,辐照的PTFE可以通过加热424 K以及高σ的回收率来回收铬。 HLEBI可能以自由基形式产生悬空键,作为受体携带电荷。由于不需要化学掺杂剂作为电荷载体,因此HLEBI可能是一种有吸引力的方法,可以实现有机膜的均匀掺杂。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号