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首页> 外文期刊>Materials transactions >An Aluminum/Polycarbonate (Al/PC) Joint by Homogeneous Low Voltage Electron Beam Irradiation (HLEBI) to PC Prior to Lamination Assembly and Hot-Press
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An Aluminum/Polycarbonate (Al/PC) Joint by Homogeneous Low Voltage Electron Beam Irradiation (HLEBI) to PC Prior to Lamination Assembly and Hot-Press

机译:在层压组件和热压之前,通过均质低压电子束辐照(HLEBI)到PC的铝/聚碳酸酯(Al / PC)接头

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摘要

A 2-layer aluminum/polycarbonate (Al/PC) joint was fabricated between half specimens of typically difficult to adhere Al and PC without use of welding, fasteners, rivets, chemical treatment or glue by a new double-step adhesion method: applying a low dose of homogeneous low energy electron beam irradiation (HLEBI) to only the PC connecting surface, prior to lamination assembly and hot press at 418 K for 3.0 min under 15 MPa pressure. Experimental results showed 0.30 MGy along with 0.22 MGy had adhesion created in all 11 samples of their data sets [11/11], although data sets of untreated (hot press alone), 0.04, 0.13 and 0.43 MGy had adhesion created in less samples in their data sets at [2/11], [2/11], [6/11] and [10/11], respectively. Moreover, applying the 0.30 MGy HLEBI exhibited the highest mean adhesive force of peeling resistance, F-o(p) over all the data sets, at all peeling probabilities (P-p). Notably, at high-P-p of 0.94 the 0.30 MGy HLEBI raised the F-o(p) significantly, 1517% from 1.48 of the untreated to 23.95 Nm(-1). Based on the 3-parameter Weibull equation, the statistically lowest F-o(p) at P-p = 0 (F-s) from 0.30 MGy-HLEBI was the highest value over all other data sets at 3.10 N.m(-1). XPS (X-ray photoelectron spectroscopy) of the peeled Al side revealed a C(1s) peak shift in binding energy from 283.8 eV (C-C) to 284.3 eV (C=C), along with increase in O(1s) C=O peak intensity (531.8 eV) indicating the 0.30 MGy HLEBI generates increased reactive double bond (pi-bond) sites which can explain stronger F-o(p) of Al/PC joint over the untreated. Since HLEBI cuts the chemical bonds and generates active terminated atoms with dangling bonds in PC polymer, the increased adhesion force in the Al/PC joint can be explained by the chemical bonding at the interface.
机译:在不使用焊接,紧固件,铆钉,化学处理或胶水的情况下,通常难以粘合Al和PC的一半试样之间通过新的双步粘合方法制造了一个2层铝/聚碳酸酯(Al / PC)接头。在层压组件和15 MPa压力下在418 K下热压3.0分钟之前,仅对PC连接表面施加低剂量的均匀低能电子束辐照(HLEBI)。实验结果表明,尽管未处理(仅热压),0.04、0.13和0.43 MGy的数据在更少的样品中产生粘附,但在其11个数据集中的所有11个样品中都产生了0.30 MGy和0.22 MGy的粘附。它们的数据集分别为[2/11],[2/11],[6/11]和[10/11]。此外,在所有数据集上,在所有数据剥离概率(P-p)下,应用0.30 MGy HLEBI均表现出最高的平均抗剥离粘合力F-o(p)。值得注意的是,在0.94的高P-p时,0.30 MGy HLEBI显着提高F-o(p),从未处理的1.48的157%升高到23.95 Nm(-1)。基于3参数的Weibull方程,在0.30 N.m(-1)的所有其他数据集中,从0.30 MGy-HLEBI到P-p = 0(F-s)的统计最低F-o(p)是最高值。剥皮的铝面的XPS(X射线光电子能谱)显示结合能从283.8 eV(CC)到284.3 eV(C = C)的C(1s)峰位移,以及O(1s)C = O的增加峰强度(531.8 eV)指示0.30 MGy HLEBI产生增加的反应性双键(pi-bond)位点,这可以解释Al / PC接头的Fo(p)比未经处理的要强。由于HLEBI切断了化学键并在PC聚合物中生成了带有悬空键的活性末端原子,因此Al / PC接头中增加的粘附力可以用界面处的化学键来解释。

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