SURFACE CHARACTERIZATION OF METHYL METHACRYLATE-POLY(ETHYLENE GLYCOL) METHACRYLATE COPOLYMERS BY SECONDARY ION MASS SPECTROMETRY AND X-RAY PHOTOELECTRON SPECTROSCOPY

摘要

Surface analysis of methyl methacrylate/poly(ethylene glycol) methacrylate copolymers has been carried out using X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectrometry (SSIMS). Both techniques confirm that solvent-cast films of these random copolymers present a surface that is very similar in composition to the bulk. A slight excess of methyl methacrylate units at the polymer/ vacuum interface was noted in the XPS spectra. SSIMS reveals that the top few monolayers of the copolymer films are typical of the bulk material and also confirm the presence of a methoxy end cap in the poly(ethylene glycol) methacrylate macromonomer structure. [References: 20]