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Instrument Combining X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectrometry for Surface Studies

机译：仪器结合X射线光电子能谱和二次离子质谱进行表面研究

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作者
Hewitt, R. W.; Shepard, A. T.; Baitinger, W. E.; Winograd, N.; Delgass, W. N.;
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年度 1978
页码 p.1-7
总页数 7
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Mass spectroscopy; Ions; Secondary; X ray photoelectron spectroscopy; Surface chemistry; Vacuum; Oxidation; Protective coatings; Gold alloys; Aluminum alloys; Foils(Materials); Reprints;

机译：质谱;离子;二级; X射线光电子能谱;表面化学;真空;氧化;保护涂层;金合金;铝合金;箔（材料）;重印;

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专利

1. COMBINED TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY AND X-RAY PHOTOELECTRON SPECTROSCOPY STUDY OF THE SURFACE SEGREGATION OF POLY(METHYL METHACRYLATE) (PMMA) IN BISPHENOL A POLYCARBONATE PMMA BLENDS [J] . Lhoest JB., Weng LT., Dewez JL., Macromolecules . 1995,第13期

机译：飞行时间二次离子质谱与X射线光电子能谱的组合研究了聚甲基丙烯酸甲酯在聚对苯二甲酸二甲酯中的表面偏聚
2. Combined use of atomic force microscopy, X-ray photoelectron spectroscopy, and secondary ion mass spectrometry for cell surface analysis [J] . Dague E, Delcorte A, Latge JP, Langmuir: The ACS Journal of Surfaces and Colloids . 2008,第7期

机译：结合使用原子力显微镜，X射线光电子能谱和二次离子质谱法进行细胞表面分析
3. Chemical Characterization of Latent Fingerprints by Matrix-Assisted Laser Desorption Ionization, Time-of-Flight Secondary Ion Mass Spectrometry, Mega Electron Volt Secondary Mass Spectrometry, Gas Chromatography/Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Attenuated Total Reflection Fourier Transform Infrared Spectroscopic Imaging: An Intercomparison [J] . Melanie. J. Bailey, Nicholas J. Bright, Ruth S. Croxton, Analytical chemistry . 2012,第20期

机译：通过基质辅助激光解吸电离，飞行时间二次离子质谱，兆电子伏特二次质谱，气相色谱/质谱，X射线光电子能谱和衰减全反射傅立叶变换红外光谱对潜在指纹进行化学表征成像：比较
4. Transformation of Pu Surface Chemistry: An X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectrometry Study [C] . A.J. Nelson, P.G. Allen, W. McLean, Plutonium futures-the science 2010 . 2010

机译：Pu表面化学的转变：X射线光电子能谱和二次离子质谱研究
5. Surface characterization of polymeric materials by x-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry: Biomedical materials and forensic applications. [D] . Lyter, Albert H., III. 1999

机译：通过X射线光电子能谱和飞行时间二次离子质谱法对聚合物材料进行表面表征：生物医学材料和法医学应用。
6. Probing albumin adsorption onto calcium phosphates by x-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry [O] . J. E. Baio, T. Weidner, G. Interlandi, -1

机译：通过X射线光电子能谱和飞行时间二次离子质谱分析探测白蛋白在磷酸钙上的吸附
7. Chemical characterization of latent fingerprints by matrix-assisted laser desorption ionization, time-of-flight secondary ion mass spectrometry, mega electron volt secondary mass spectrometry, gas chromatography/mass spectrometry, X-ray photoelectron spectroscopy, and attenuated total reflection Fourier transform infrared spectroscopic imaging: an intercomparison [O] . Bailey, Melanie J., Bright, Nicholas J., Croxton, Ruth S., 2012

机译：潜在指纹的化学表征，包括基质辅助激光解吸电离，飞行时间二次离子质谱，兆电子伏特二次质谱，气相色谱/质谱，X射线光电子能谱和衰减全反射傅里叶变换红外光谱成像：比较

Instrument Combining X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectrometry for Surface Studies

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