Dielectric Properties of CaCu_3Ti_4O_(12)/CaTiO_3 Multilayer Thin Films Synthesized by PLD Method

摘要

In order to elucidate the origin of the characteristic dielectric response of CaCu_3Ti_4O_(12) (CCTO), we synthesize c-axis oriented multilayer thin films composed of alternative layers of CCTO and an insulator CaTiO_3 (CTO) using the Pulsed Laser Deposition (PLD) method and measure the capacitance of CTO/CCTO/CTO multilayer thin films with different thicknesses of CTO and CCTO layers. After removing the extrinsic elec-trode/CCTO boundary effect and the CCTO/CTO interface effect, the inherent dielectric constant of CCTO is determined.