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机译:
MESA+ Institute for Nanotechnology, Semiconductor Components Group, University of Twente, P.O. Box 217, 7500 AE Enschede, The Netherlands;
机译:Degradation of High-Frequency Noise in nMOSFETs Under Different Modes of Hot-Carrier Stress
机译:Change in Transfer and Low-Frequency Noise Characteristics of n-Channel Polysilicon TFTs Due to Hot-Carrier Degradation
机译:TID Response and Radiation-Enhanced Hot-Carrier Degradation in 65-nm nMOSFETs: Concerns on the Layout-Dependent Effects
机译:基于Noise2Noise深度学习的纳米通道测量无监督降噪
机译:堆肥作为处理特定危险物质和degradation病毒降解的方法。
机译:氟化HfO2 / SiON栅堆叠的单轴应变nMOSFET的电学特性
机译:Desempenho de escolares de 7 a 12 anos no test 7-12-kids-Noise-in-Noise测试中的噪音差距
机译:poly-gamma-Glutamate Capsule-Degrading Enzyme处理增强了包裹的炭疽杆菌的吞噬作用和杀灭作用