Method for Determining the Depleted Zone Thickness in Silicon Charged Particle Detectors

摘要

A method for determining the thickness of silicon charge particle detectors has been developed. Themethod is based on measurements of spectra from a standard 137Cs y source, whose shape changes with detectorthickness. The method can be used in the thickness range –50-6000 inn with an accuracy from 20 to 10%,respectively. No complex equipment or laborious calculations are needed.