RELAXATION AND HYSTERESIS DIELECTRIC PROCESSES AT LOW AND INFRALOW FREQUENCIES IN THIN SOL-GEL Ni/PZT/Pt FILMS

摘要

The results of the study of relaxation and hysteresis dielectric properties of the Ni/PZT/Pt thin ferroelectric films with different lead excess in the initial film-forming solution are presented. Polarization and repolarization characteristics are measured in a wide range of fields, frequencies, and temperatures. The results are discussed from the point of view of interaction of domain walls and a repolarized volume with point defects and interface fields.