Techniques and Applications of the Simulated Pattern Adaptation of Wilkinson's Method for Advanced Microstructure Analysis and Characterization of Plastic Deformation

摘要

Electron Backscatter Diffraction (EBSD) based Orientation Imaging Microscopy (OIM) is used routinely at ~500 materials laboratories worldwide for the characterization and development of diverse crystalline materials. Statistically significant data sets (~10 ~7 individual EBSD measurements) can be collected and analyzed within time periods of acceptable beam stability (~10 ~5s). However, limitations in angular and spatial resolution have motivated a continued search for more robust EBSD-based methods. Herein is a gathered presentation of advanced techniques in use, intended as a guide to researchers in selecting the most appropriate method for their work. Wilkinson's method has been shown to increase angular resolution nearly two orders of magnitude to ±0.006°, facilitating measurement of elastic strain, lattice curvature, and dislocation density. A simulated pattern adaptation of Wilkinson's method extends these measurement capabilities to polycrystalline materials, by avoiding the need for an experimental strain free reference pattern. The angular resolution limit obtained is ~0.04°. Accurate pattern center calibration, essential to the high resolution methods, is accomplished by parallelization of band edges projected onto a sphere centered at the interaction volume. FFT powered cross-correlation functions improve the spatial resolution near grain boundaries and correct for measurement inaccuracies induced by overlapping patterns. To corroborate these claims, exemplary results taken from a wedge-indented nickel single crystal, cold-worked copper polycrystal, and rolled nickel polycrystal are shown.