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Build-up of interference patterns with single electrons

机译:单电子干涉图的建立

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A conventional transmission electron microscope, equipped with a fast recording system able to measure the electron arrival time and the position of single electrons, is used to show the build-up of interference patterns. Two experiments are presented. The first is the electron version of the Grimaldi and Young experiments performed with light, where single electrons strike on an opaque thin wire. Interference fringes are observed in the geometrical shadow of the wire and diffraction effects are clearly displayed at the wire edges. The second, original experiment reports the build-up of two-slit interference patterns with single electrons.
机译:配备有能够测量电子到达时间和单个电子位置的快速记录系统的常规透射电子显微镜用于显示干涉图的形成。提出了两个实验。第一个是使用光进行的Grimaldi和Young实验的电子版本,其中单个电子撞击不透明的细线上。在导线的几何阴影中观察到干涉条纹,并且在导线边缘清楚地显示出衍射效应。第二个原始实验报告了具有单个电子的两缝干涉图案的建立。

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