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首页> 外文期刊>Brain & Development >Clinical and molecular genetics of myoclonic-astatic epilepsy and severe myoclonic epilepsy in infancy (Dravet syndrome).
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Clinical and molecular genetics of myoclonic-astatic epilepsy and severe myoclonic epilepsy in infancy (Dravet syndrome).

机译:婴儿肌阵挛性静止性癫痫和严重肌阵挛性癫痫的临床和分子遗传学(Dravet综合征)。

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摘要

The majority of severe epileptic encephalopathies of early childhood are symptomatic where a clear etiology is apparent. There is a small subgroup, however, where no etiology is found on imaging and metabolic studies, and genetic factors are important. Myoclonic-astatic epilepsy (MAE) and severe myoclonic epilepsy in infancy (SMEI), also known as Dravet syndrome, are epileptic encephalopathies where multiple seizure types begin in the first few years of life associated with developmental slowing. Clinical and molecular genetic studies of the families of probands with MAE and SMEI suggest a genetic basis. MAE was originally identified as part of the genetic epilepsy syndrome generalized epilepsy with febrile seizures plus (GEFS(+)). Recent clinical genetic studies suggest that SMEI forms the most severe end of the spectrum of the GEFS(+). GEFS(+) has now been associated with molecular defects in three sodium channel subunit genes and a GABA subunit gene. Molecular defects of these genes have been identified in patients with MAE and SMEI. Interestingly, the molecular defects in MAE have been found in the setting of large GEFS(+) pedigrees, whereas, more severe truncation mutations arising de novo have been identified in patients with SMEI. It is likely that future molecular studies will shed light on the interaction of a number of genes, possibly related to the same or different ion channels, which result in a severe phenotype such as MAE and SMEI.
机译:儿童早期大多数严重的癫痫性脑病是有症状的,病因明显。但是,有一个很小的亚组,在成像和代谢研究中未发现病因,并且遗传因素很重要。肌阵挛性静止性癫痫(MAE)和婴儿期严重的肌阵挛性癫痫(SMEI),也称为Dravet综合征,是癫痫性脑病,其中多种癫痫发作类型在与发育减慢相关的生命的头几年开始。对具有MAE和SMEI的先证者家族的临床和分子遗传学研究提示了遗传基础。 MAE最初被确定为遗传性癫痫综合征的一部分,伴有高热惊厥(GEFS(+))。最近的临床遗传研究表明,SMEI构成了GEFS(+)谱图中最严重的末端。 GEFS(+)现在已经与三个钠通道亚基基因和一个GABA亚基基因中的分子缺陷有关。在MAE和SMEI患者中已经鉴定出这些基因的分子缺陷。有趣的是,在大型GEFS(+)谱系中发现了MAE中的分子缺陷,而在SMEI患者中发现了从头出现的更严重的截短突变。未来的分子研究可能会揭示许多基因的相互作用,这些基因可能与相同或不同的离子通道有关,从而导致严重的表型,如MAE和SMEI。

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