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Development of chip-on-flex using SBB flip-chip technology

机译:使用SBB倒装芯片技术开发柔性芯片

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A bare LSI chip mounted onto a flexible substrate is called chip-on-flex (COF). Companies and universities are desperately developing COF. In this paper, the development of COF using stud bump bonding (SB B) flip-chip technology will be introduced. So far, SBB technology has been adopted when ceramic or glass-epoxy is used as a substrate material for chip size packages (CSPs) and multi-chip modules (MCMs). Recently there is a great demand for developing SBB technology toward a flexible substrate. SBB technology needs to keep a flexible substrate flat during the assembly process. A flexible substrate was adhered to a flat carrier using a thermal release sheet in order to keep it flat. Since this thermal release sheet loses its adhesive strength by applying heat beyond 160℃, it is easy to peel off accomplished specimens from the flat carrier after assembling. SBB specimens were prepared using liquid crystal polymer (LCP) and polyimide (PI) as a flexible substrate. Reliability tests, such as pressure cooker test (PCT), thermal shock test (TST) and reflow soldering after moisture storage test, were carried out for these specimens. In PCT, both LCP and PI specimens passed as a result of using proper underfill for each substrate. In TST, both specimens also passed using the underfill selected in PCT. In reflow soldering after moisture storage test, LCP specimens passed, on the other hand PI specimens needed to be baked after moisture storage in order to pass the reflow.
机译:安装在柔性基板上的裸LSI芯片称为柔性芯片(COF)。企业和大学都在拼命发展COF。本文将介绍采用螺柱凸块键合(SB B)倒装芯片技术的COF开发。到目前为止,当陶瓷或微晶环氧树脂用作芯片尺寸封装(CSP)和多芯片模块(MCM)的基板材料时,SBB技术已被采用。最近,对开发SBB技术以柔性基板的需求很大。SBB技术需要在组装过程中保持柔性基板平坦。使用热释放片将柔性基板粘附在扁平载体上,以保持其平整。由于这种热释片在施加超过160°C的热量时会失去其粘合强度,因此在组装后很容易从扁平载体上剥离完成的试样。以液晶聚合物(LCP)和聚酰亚胺(PI)为柔性基底制备SBB试样。对这些试样进行了可靠性测试,例如压力锅测试(PCT)、热冲击测试(TST)和储湿测试后的回流焊。在PCT中,LCP和PI试样都是通过对每个基材使用适当的底部填充胶的结果。在TST中,两个试样也使用PCT中选择的底部填充胶通过。在回流焊后储水试验中,LCP试样通过,而PI试样则需要在储湿后烘烤才能通过回流焊。

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