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Supercritical Fluid Deposition of Conformal SrTiO_3 Films with Composition Uniformity in Nanocontact Holes

机译:纳米接触孔中具有组成均匀性的共形SrTiO_3薄膜的超临界流体沉积

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摘要

SrTiO_3 with a high dielectric constant is considered a promising capacitor dielectric for dynamic random access memory. Until now, a SrTiO_3 deposition with compositional uniformity and perfect conformality inside high-aspect nanoscale holes has been difficult by chemical vapor deposition (CVD) and atomic layer deposition (ALD). In this study, we report a supercritical fluid deposition (SCFD) of SrTiO_3. Compared to CVD SrTiO_3, the SCFD SrTiO_3 showed perfect conformality and compositional uniformity inside nanosize holes. From these results, the SCFD is expected to be a solution for the stoichiometry and conformality issues of the CVD and ALD SrTiO_3.
机译:具有高介电常数的SrTiO_3被认为是用于动态随机存取存储器的有前途的电容器电介质。迄今为止,通过化学气相沉积(CVD)和原子层沉积(ALD)很难在高纵横比纳米孔内形成具有组成均匀性和完美共形性的SrTiO_3。在这项研究中,我们报告了SrTiO_3的超临界流体沉积(SCFD)。与CVD SrTiO_3相比,SCFD SrTiO_3在纳米孔内显示出完美的共形性和组成均匀性。从这些结果来看,SCFD有望成为CVD和ALD SrTiO_3的化学计量和保形性问题的解决方案。

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