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A Model of Pad-Abrasive Interactions in Chemical Mechanical Polishing

机译:化学机械抛光中磨料-磨料相互作用的模型

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摘要

In model descriptions of CMP, slurry abrasives stick to and release from the polishing pad. This model extension predicts how pad-abrasive interactions depend on abrasive size. The prediction is compared to five sets of experimental data for systems using silica or alumina abrasives and different pads to polish copper, tungsten, or tantalum under various experimental conditions. The finding that larger particles are harder to dislodge from the pad than smaller ones holds over two orders of magnitude in abrasive diameter. This affects material removal rates which depend on the number of abrasive particles attached to the pad.
机译:在CMP的模型描述中,浆状磨料粘附并从抛光垫上释放。该模型扩展预测了垫磨料相互作用如何取决于磨料尺寸。将预测结果与使用二氧化硅或氧化铝磨料和不同抛光垫在各种实验条件下抛光铜,钨或钽的系统的五组实验数据进行比较。大颗粒比小颗粒更难从垫子上脱落的发现在磨料直径上占据了两个数量级。这影响了材料去除速率,该去除速率取决于附着在垫上的磨料颗粒的数量。

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