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Low-Resistance and Reflective Ni/Rh and Ni/Au/Rh Contacts to p-GaN for Flip-Chip LEDs

机译:低电阻和反射性Ni / Rh和Ni / Au / Rh与p-GaN接触的倒装芯片LED

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摘要

We report on the formation of high-quality ohmic contacts to p-type GaN (4 X 10~(17) cm~3) using Ni (5 nm)/Rh (120 nm) and Ni (5 nm)/Au (5 nm)/Rh (120 nm) schemes for use in flip-chip light-emitting diodes (LEDs). Both the Ni/Rh and Ni/Au/Rh contacts become ohmic with specific contact resistances of 10~(-5) to 10~(-6) OMEGA cm~2, when annealed at 350 deg C for 2 min in air ambient. LEDs are fabricated using the Ni/Au/Rh and Ni/Au contact layers, which give a forward-bias voltage of 3.32 and 3.45 V at injection current of 20 mA, respectively. This indicates that the Rh-based contacts could be suitable for high power flip-chip LEDs.
机译:我们报告了使用Ni(5 nm)/ Rh(120 nm)和Ni(5 nm)/ Au(5)与p型GaN(4 X 10〜(17)cm〜3)形成高质量欧姆接触的情况倒装芯片式发光二极管(LED)中使用的最大nm / Rh(120 nm)方案。 Ni / Rh和Ni / Au / Rh触点在空气环境中于350℃退火2分钟时,其欧姆接触电阻为10〜(-5)至10〜(-6)OMEGA cm〜2。使用Ni / Au / Rh和Ni / Au接触层制造LED,它们在注入电流为20 mA时分别提供3.32和3.45 V的正向偏置电压。这表明基于Rh的触点可能适用于大功率倒装芯片LED。

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