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The Nature of Nanometer Timing Failures

机译:纳米定时故障的性质

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Timing failures are not catastrophic but show a clock frequency capability that is less than the product specification. There may be windows of pass or fail, and timing failures can occur in an IC with or without the presence of defects. A simple example of intrinsic IC failure occurs when the clock frequency is turned up on a perfectly good IC-all ICs will fail at some maximum operating clock frequency. Why? There are several reasons, and all of them ultimately violate design timing rules. Statistical variation within the IC can cause defect-free failure at frequencies below the product specification. It is the statistical interaction of random parameter values from the manufacturing process that can cause intrinsic frequency failure. Extrinsic timing failures are those with defects in the signal path. Resistive vias are a good example of one source of extrinsic timing failures.
机译:时序故障不是灾难性的,而是显示出时钟频率能力低于产品规格。可能存在通过或失败的窗口,并且在有或没有缺陷的情况下,IC都可能发生时序故障。当一个非常好的IC上的时钟频率调高时,就会发生一个固有的IC故障的简单例子,所有IC都将在某个最大工作时钟频率下发生故障。为什么?原因有很多,所有这些最终都违反了设计时序规则。 IC内的统计变化可能会在低于产品规格的频率下导致无缺陷故障。制造过程中随机参数值的统计相互作用可能导致固有频率故障。外部时序故障是指信号路径中存在缺陷的故障。电阻过孔是外部时序失败的一种很好的例子。

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