Two-Resonator Method for Characterization ofDielectric Substrate Anisotropy

摘要

A two-resonator method, based on TE_(011)-mode and TM_(010)-moderesonance cavities with a disk sample has been developed for measurement ofthe longitudinal and transversal dielectric constants and dielectric loss tangent ofdielectric substrates (dielectric anisotropy), used in modern electronics. The the-oretical background of the method is presented: the analytical expressions of thedispersion equations for the considered modes in both cavities and expressionsof the energy balance for computation of the permittivity and the dielectric losstangent of the unknown sample in two directions. The sensitivity and the mea-surement errors are discussed. Practical examples are given for illustration ofthe dielectric anisotropy characterization of modern reinforced substrates withbuilt-in woven glass cloth and filling plastics or powders.