Measurement of Dielectric Anisotropy of Microwave Substrates by Two-resonator Method with Different Pairs of Resonators

摘要

The measurement of the dielectric constant and loss tangent anisotropy of the planar RF substrates by the two-resonator method is considered in this paper. The principles of the separate determination of these parameters parallel and perpendicular to the substrate surface is discussed by three pairs of cavity measurement resonators, based on cylinder, reentrant, split cylinder and split post dielectric resonators. Examples of the measured anisotropy of known materials are presented.