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Effect of molybdenum doping on the electrochromic properties of tungsten oxide thin films by RF magnetron sputtering

机译:射频磁控溅射钼掺杂对氧化钨薄膜电致变色性能的影响

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摘要

Thin films of pure and molybdenum (Mo)-doped tungsten trioxide (WO3) were deposited on indium tin oxide (ITO)-coated glass and Coming glass substrates by RF magnetron sputtering technique. The effect of Mo doping on the structural, morphological, optical and electrochromic properties of WO3 films was studied systematically. The energy dispersive X-ray analysis (EDAX) revealed that the films consist of molybdenum concentrations from 0 to 2 at.%. X-ray diffraction (XRD) studies indicated that with the increase of Mo concentration the structural phase transformation takes place from polycrystalline to amorphous phase. The crystallite size of the films decreased from 24 to 12 nm with increase of doping concentration of Mo in WO3. Scanning electron microscope (SEM) analysis revealed that Mo dopant led to significant changes in the surface morphology of the films. The electrochemical and electrochromic performance of the pure and Mo-doped WO3 were studied. The WO3 films formed with 1.3 at.% Mo dopant concentration exhibited high optical modulation of 44.3 % and coloration efficiency of 42.5 cm~2/C.
机译:通过RF磁控溅射技术,将纯钼掺杂的三氧化钨(WO3)薄膜沉积在涂有氧化铟锡(ITO)的玻璃和Coming玻璃基板上。系统研究了Mo掺杂对WO3薄膜的结构,形貌,光学和电致变色性能的影响。能量色散X射线分析(EDAX)表明,该膜由0至2原子%的钼浓度组成。 X射线衍射(XRD)研究表明,随着Mo浓度的增加,结构相从多晶相转变为非晶相。随着WO 3中Mo掺杂浓度的增加,薄膜的微晶尺寸从24nm减小到12nm。扫描电子显微镜(SEM)分析表明,Mo掺杂剂导致薄膜的表面形态发生了显着变化。研究了纯钼和掺钼WO3的电化学和电致变色性能。以1.3at。%的Mo掺杂剂浓度形成的WO3薄膜表现出44.3%的高光学调制度和42.5cm〜2 / C的着色效率。

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