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Quantitative electron probe microanalysis of boron

机译:硼的定量电子探针显微分析

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Quantitative electron probe microanalysis of boron has been performed in 28 binary borides in the range of 4-30 kV. In principle, intensity measurements of ultra-light element radiations can only be performed correctly if the effects of peak shifts and peak shape alterations between specimens and standard are taken into account. The analysis of boron is further complicated by the fact that the peak shape may also be dependent on the crystallographic orientation of the specimen with respect to the electron beam and spectrometer. This was found to be the case in 50% of the compounds investigated. However, if the measurements are performed properly, and if a good matrix correction program is used in conjunction with a consistent set of mass absorption coefficients, it is possible to obtain a narrow error distribution. The final histogram, displaying the number of analyses versus the ratio between calculated and measured intensity ratios that we obtained for 192 analyses with our PROZA96 program, had a root-mean-square value of 3.31% and a mean value of 1.0022. (C) 2000 Academic Press. [References: 23]
机译:在4-30 kV范围内的28种二元硼化物中进行了硼的定量电子探针显微分析。原则上,只有考虑到样品与标准品之间峰移动和峰形变化的影响,才能正确执行超轻元素辐射的强度测量。硼的分析更加复杂,因为峰的形状也可能取决于样品相对于电子束和光谱仪的晶体取向。发现在所研究的化合物中有50%是这种情况。但是,如果测量正确执行,并且如果将良好的矩阵校正程序与一组一致的质量吸收系数结合使用,则可能会获得较窄的误差分布。最终的直方图显示了分析次数与我们使用PROZA96程序对192次分析获得的计算强度比与测量强度比之间的比率,其均方根值为3.31%,平均值为1.0022。 (C)2000年学术出版社。 [参考:23]

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