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首页> 外文期刊>International journal of mass spectrometry >Secondary ion yield improvements for phosphated and sulfated molecules using substrate-enhanced time-of-flight secondary ion mass spectrometry
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Secondary ion yield improvements for phosphated and sulfated molecules using substrate-enhanced time-of-flight secondary ion mass spectrometry

机译:使用基质增强的飞行时间二次离子质谱技术提高磷酸化和硫酸化分子的二次离子产率

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Aminoethanethiol (AET), at an appropriate pH, forms a charged self-assembled monolayer (SAM) on Au surfaces. We have shown that an AET-SAM can be used to adsorb organic and inorganic anions from aqueous and ethanol solutions. The adsorbed anions can then be sputtered with high efficiency for characterization by time-of-flight secondary ion mass spectrometry. We present here the application of the AET monolayer for the characterization of more complex and biologically relevant organic sulfates and phosphates up to 1150 Daltons, each featuring a charged anionic site to facilitate the adsorption to the monolayer by ion-pair formation. We monitored the mass spectra and secondary ion emission following 20 keV (CsI)_nCs~+ (n = 0-2) projectile impacts on targets composed of thin layers deposited on Si, Au, and AET/Au substrates; and of thick targets (thick with respect to the 10-100 nm range of projectile). For each molecule used in this study, the secondary ion yield increased when the anion was deposited as a thin layer, relative to a thick layer, and is greatest for AET/Au substrates compared to bare Au and polished Si substrates. Additionally, the intact-to-fragment ion yield ratio is lower when sputtering from the solid salt target than from the AET monolayer.
机译:在适当的pH值下,氨基乙硫醇(AET)在Au表面形成带电荷的自组装单层(SAM)。我们已经表明,AET-SAM可用于从水溶液和乙醇溶液中吸附有机和无机阴离子。然后可以通过飞行时间二次离子质谱法高效地溅射吸附的阴离子以进行表征。我们在此介绍AET单层在表征高达1150道尔顿的更复杂和生物学相关的有机硫酸盐和磷酸盐方面的应用,每种有机硫酸盐和磷酸盐的特征是带电荷的阴离子位点,以促进通过离子对形成吸附至单层。我们监测了20 keV(CsI)_nCs〜+(n = 0-2)弹丸对由沉积在Si,Au和AET / Au衬底上的薄层组成的靶材的撞击后的质谱和二次离子发射;和较厚的目标(较厚的射弹10-100 nm范围)。对于本研究中使用的每个分子,当阴离子以薄层形式沉积时(相对于厚层而言),二次离子产率都会增加,并且与裸金和抛光Si衬底相比,AET / Au衬底的二次离子产率最高。另外,当从固体盐靶溅射时,完整离子与碎片离子的产率比从AET单层溅射的离子产率低。

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