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首页> 外文期刊>International Journal of Computational Engineering Science(IJCES) >HERMETIC PACKAGING OF MEMS WITH THICK ELECTRODES BY SILICON-GLASS ANODIC BONDING
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HERMETIC PACKAGING OF MEMS WITH THICK ELECTRODES BY SILICON-GLASS ANODIC BONDING

机译:硅玻璃阳极键合对厚电极MEMS的气密包装

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摘要

Thick electrodes, which are widely used in micro-electro-mechanical system (MEMS) devices, create serious surface imperfection and would result in a low-quality bond or even debonding. In this work, the influence of electrode thickness on hermetic sealing was investigated. Two approaches to realise hermetic sealing via anodic bonding of silicon to glass with thick electrodes are presented Embedded electrode is one method in which metal was deposited on shallow trench etched on the surface of wafers and planarisation of bonding surface was performed with a Chemical Mechanical Polishing (CMP) process. Another approach, called vertical via electrode method, is to form vertical electrodes through vias by deposition and patterning of metal film.
机译:广泛用于微机电系统(MEMS)装置中的厚电极会产生严重的表面瑕疵,并会导致低质量的键合甚至脱落。在这项工作中,研究了电极厚度对气密性的影响。提出了两种通过使用厚电极将硅与玻璃进行阳极键合来实现气密密封的方法,嵌入式电极是一种方法,其中将金属沉积在蚀刻在晶片表面的浅沟槽上,然后用化学机械抛光对键合表面进行平坦化处理( CMP)过程。称为垂直通孔电极方法的另一种方法是通过金属膜的沉积和图案化来形成穿过通孔的垂直电极。

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