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Characteristics of ray traces at the back of biaxial crystals at normal incidence

机译:法向入射时双轴晶体背面的射线迹线特征

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摘要

Ray vector traces that can be obtained at the back of a biaxial crystal through crystal rotation are calculated numerically by variation of one of the three Euler angles. Negative and positive lossless biaxial crystals are considered at normal incidence. Interesting features of these traces are evidenced by reference to the circular ring that forms at internal conical refraction.
机译:通过改变三个欧拉角之一来数值计算通过晶体旋转可以在双轴晶体背面获得的射线矢量迹线。负和正无损双轴晶体被认为是垂直入射。这些痕迹的有趣特征可以通过在内部圆锥形折射时形成的圆环来证明。

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