Numerical Simulation of Scanning Electrochemical Microscopy Experiments with Frame-Shaped Integrated Atomic Force Microscopy-SECM Probes Using the Boundary Element Method

摘要

Integrated submicroelectrodes for combined AFM--SECM measurements are characterized with numerical simulations using the boundary element method. SECM approach curves and SECM images are calculated and analyzed for a model substrate containing pronounced topographical and electrochemical features. The theoretically calculated image has been compared to the experiments data and shows excellent quantitative agreement. Hence, the applicability of integrated AFM--SECM electrodes for combined electrochemical and topographical imaging and a profound theoretical description including quantification of the obtained results are demonstrated.