Atomic Force MIcroscopy and Scanning Tunneling Microscopy with a Combination Atomic Force Microscope/Scanning Tunneling Microscopy

摘要

Since almost all the electronic and mechanical requirements for an atomic force microscope (AFM) are the same as for a scanning tunneling (STM), it is convenient and practical to build a combination AFM/STM with interchangeable heads. The conversion from one to the other can be made in a few minutes. Representative images demonstrate that atomic resolution can be obtained in both modes of operation. With the two modes of operation, it can image conductors, semiconductors, and insulators. (mjm)