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Heterogeneity Assessment in Individual CaCO_(3)-CaSO_(4) Particles Using Ultrathin Window Electron Probe X-ray Microanalysis

机译:使用超薄窗电子探针X射线显微分析对单个CaCO_(3)-CaSO_(4)颗粒进行异质性评估

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In our previous studies, it has been demonstrated that both the excitation interactions between electrons and the atoms of the matrix and the matrix and geometric effects of electron-induced X-ray signals can be described by Monte Carlo simulation for low-Z elements, such as carbon, nitrogen, and oxygen, in individual atmospheric microparticles. In addition, by the application of a quantification method, which employs Monte Carlo simulation combined with successive approximations, at least semiquantitative specification of the chemical compositions could be done. This has enlarged the scope of electron probe X-ray microanalysis (EPMA) for the single particle analysis of atmospheric environmental aerosol particles, In this work, we demonstrate that the heterogeneity of individual particles, even of micrometer size, can be characterized by the application of EPMA. X-ray photons obtained with different primary electron beam energies carry information on the chemical compositions for different regions in the particles. Artificially generated heterogeneous CaCO_(3)-CaSO_(4) individual particles were measured at different accelerating voltages, and it was found that the Monte Carlo calculation is a powerful technique to extract the information on the heterogeneity of the particles that is contained in the measured X-ray data. Our approach can even estimate the thickness of the surface CaSO_(4) species by the application of the Monte Carlo calculation. A preliminary result for carbon-coated glass particles is also presented. The complexity involved in the analysis of real world particles is briefly mentioned with a result for heterogeneous SiO_(2) particle.
机译:在我们以前的研究中,已经证明,电子和基质原子之间的激发相互作用以及基质对电子和X射线信号的几何效应都可以通过针对低Z元素的Monte Carlo模拟来描述,例如在单个大气微粒中为碳,氮和氧。另外,通过采用结合蒙特卡罗模拟和逐次逼近的定量方法,可以完成化学成分的至少半定量说明。这扩大了电子探针X射线微分析(EPMA)的范围,用于大气环境气溶胶颗粒的单颗粒分析。在这项工作中,我们证明了单个颗粒的异质性,即使是微米大小,也可以通过应用来表征EPMA。用不同的一次电子束能量获得的X射线光子携带有关粒子中不同区域的化学成分的信息。在不同的加速电压下对人工生成的异质CaCO_(3)-CaSO_(4)单个粒子进行了测量,发现蒙特卡洛计算是一种强大的技术,可以提取出被测物中所含粒子的异质性信息X射线数据。我们的方法甚至可以通过应用蒙特卡洛计算来估计表面CaSO_(4)种类的厚度。还提供了碳涂层玻璃颗粒的初步结果。简要提到了现实世界粒子分析中涉及的复杂性,并得出了非均质SiO_(2)粒子的结果。

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