首页> 外文期刊>Analytical chemistry >USE OF X-RAY POWDER DIFFRACTION FOR DETERMINING LOW LEVELS OF CHRYSOTILE ASBESTOS IN GYPSUM-BASED BULK MATERIALS - SAMPLE PREPARATION
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USE OF X-RAY POWDER DIFFRACTION FOR DETERMINING LOW LEVELS OF CHRYSOTILE ASBESTOS IN GYPSUM-BASED BULK MATERIALS - SAMPLE PREPARATION

机译:利用X射线粉末衍射测定石膏基散装材料中的低温结晶橡胶残留量-样品制备

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摘要

An X-ray diffraction procedure for quantitative chrysotile asbestos analysis in a gypsum-based matrix is discussed, The procedure includes calibration standards preparation, an EDTA treatment to remove gypsum, sample milling, and X-ray diffraction analysis, The effect of each step is discussed. Morphological and crystal structural changes due to the sample preparation procedure were also characterized using techniques such as SEM, IR, NMR and ICP. Through a statistically designed experiment, it is demonstrated that-X-ray diffraction can be used as a reliable technique in gypsum-based matrices to determine chrysotile concentration from 0.25% to 2.5% with a standard deviation of 0.07%.
机译:讨论了用于在石膏基基质中进行温石棉石棉定量分析的X射线衍射程序,该程序包括校准标准品的制备,EDTA处理以去除石膏,样品研磨和X射线衍射分析,每个步骤的效果是讨论过。还使用诸如SEM,IR,NMR和ICP等技术对由于样品制备程序而引起的形态和晶体结构变化进行了表征。通过统计设计的实验,证明了X射线衍射可以用作石膏基基质中的可靠技术,可测定0.25%至2.5%的温石棉浓度,标准偏差为0.07%。

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