Adhesion Forces Measured by Atomic Force Microscopy in Humid Air

摘要

Adhesive forces measured with an atomic force microscope under ambient conditions are generally regarded to be dominated by non-surface-specific capillary force. In this study, the nature of the "pull-off" force on a variety of surfaces was investigated as a function of relative humidity. The results indicate that even under the condition where capillary condensation occurs there is chemical specificity in the measured pull-off force. Issues such as tip-surface contact time and surface roughness were ruled out as possible artifacts. A mathematical model of pull-off force as a function of relative humidity is proposed in which the chemical specificity is explained.