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Adhesion force between particles and substrate in a humid atmosphere studied by atomic force microscopy

机译:原子力显微镜研究潮湿环境下颗粒与基材之间的附着力

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Using an atomic force microscope (AFM), adhesion forces between glass particles or AFM tips and hydrophilic or hydrophobic substrates were measured as a function of relative humidity (RH). The observed adhesion force between the glass particles and the hydrophilic substrate increased with RH due to strong capillary condensation. In contrast, the adhesion force between the glass particles and the hydrophobic substrate was found to be almost constant for all RHs, due to weak capillary condensation. The adhesion force between an AFM tip and a mica plate had a maximum value at a certain RH. This can be evaluated by calculating with consideration for the tip shape. On the other hand, the adhesion force for a silica plate increased drastically over a certain RH and could be explained due to the surface roughness of the silica plate. The presence of nanometer-scale roughness can play a critical role in the absolute value of the adhesion force between an AFM tip and the substrate in a humid atmosphere.
机译:使用原子力显微镜(AFM),测量玻璃颗粒或AFM尖端与亲水性或疏水性基材之间的粘附力,作为相对湿度(RH)的函数。由于强烈的毛细管凝结,观察到的玻璃颗粒和亲水性基材之间的粘附力随RH而增加。相比之下,由于微弱的毛细管凝结,发现对于所有RH,玻璃颗粒与疏水性基材之间的粘附力几乎恒定。在一定的相对湿度下,AFM尖端与云母板之间的粘附力具有最大值。可以通过考虑尖端形状来进行评估。另一方面,对于二氧化硅板的粘附力在一定的RH下急剧增加,并且可以解释为由于二氧化硅板的表面粗糙度。纳米级粗糙度的存在对于在潮湿环境中AFM尖端与基材之间的粘附力的绝对值起着至关重要的作用。

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