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Statistical Analysis of Long- and Short-Range Forces Involved in Bacterial Adhesion to Substratum Surfaces as Measured Using Atomic Force Microscopy

机译:使用原子力显微镜测量的细菌与基质表面粘附的长程和短程力的统计分析

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摘要

Surface thermodynamic analyses of microbial adhesion using measured contact angles on solid substrata and microbial cell surfaces are widely employed to determine the nature of the adhesion forces, i.e., the interplay between Lifshitz-van der Waals and acid-base forces. While surface thermodynamic analyses are often viewed critically, atomic force microscopy (AFM) can also provide information on the nature of the adhesion forces by means of Poisson analysis of the measured forces. This review first presents a description of Poisson analysis and its underlying assumptions. The data available from the literature for different combinations of bacterial strains and substrata are then summarized, leading to the conclusion that bacterial adhesion to surfaces is generally dominated by short-range, attractive acid-base interactions, in combination with long-range, weaker Lifshitz-van der Waals forces. This is in line with the findings of surface thermodynamic analyses of bacterial adhesion. Comparison with single-molecule ligand-receptor forces from the literature suggests that the short-range-force contribution from Poisson analysis involves a discrete adhesive bacterial cell surface site rather than a single molecular force. The adhesion force arising from these cell surface sites and the number of sites available may differ from strain to strain. Force spectroscopy, however, involves the tedious task of identifying the minor peaks in the AFM retraction force-distance curve. This step can be avoided by carrying out Poisson analysis on the work of adhesion, which can also be derived from retraction force-distance curves. This newly proposed way of performing Poisson analysis confirms that multiple molecular bonds, rather than a single molecular bond, contribute to a discrete adhesive bacterial cell surface site.
机译:使用在固体基质和微生物细胞表面上测量的接触角对微生物粘附进行表面热力学分析,广泛用于确定粘附力的性质,即,Lifshitz-van der Waals和酸碱力之间的相互作用。尽管经常对表面热力学分析进行批判性观察,但原子力显微镜(AFM)也可以通过对测得力的泊松分析来提供有关粘附力性质的信息。本文首先介绍了泊松分析及其基本假设。然后总结了可从文献中获得的有关细菌菌株和基质不同组合的数据,得出的结论是,细菌与表面的粘附通常由短程,有吸引力的酸碱相互作用以及长程,较弱的Lifshitz共同控制。 -范德华力。这与细菌粘附的表面热力学分析的结果一致。与文献中的单分子配体-受体力比较表明,泊松分析的短程力贡献涉及离散的粘附细菌细胞表面部位,而不是单个分子力。由这些细胞表面位点产生的粘附力和可用位点的数目可能因菌株而异。然而,力谱法涉及繁琐的任务,即确定AFM收缩力-距离曲线中的次要峰。通过对附着力进行泊松分析可以避免此步骤,这也可以从回缩力-距离曲线得出。这种新提出的进行泊松分析的方法证实,多个分子键而不是单个分子键有助于离散的粘附细菌细胞表面部位。

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