Orthoclase surface structure dissolution measured in situ by x-ray reflectivityand atomic force microscopy

摘要

Orthoclase (001) surface topography and interface structure were measured duringdissolution by using in situ atomic force microscopy (AFM) and synchrotrons X-ray reflectivity at pH 1.1-12.9 and T = 25-84 C. Terrace roughening at low pH and step motion at high pH were the main phenomena observed, and dissolution rates