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首页> 外文期刊>ACS applied materials & interfaces >Ultraviolet Wavelength-Dependent Optoelectronic Properties in Two-Dimensional NbSe2-WSe2 van der Waals Heterojunction-Based Field-Effect Transistors
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Ultraviolet Wavelength-Dependent Optoelectronic Properties in Two-Dimensional NbSe2-WSe2 van der Waals Heterojunction-Based Field-Effect Transistors

机译:二维NBSe2-WSE2范德瓦尔斯的紫外波长依赖性光电性能,基于异质结的场效应晶体管

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Atomically thin two-dimensional (2D) van der Waals (vdW) heterostructures are one of the very important research issues for stacked optoelectronic device applications. In this study, using the transferred and stacked NbSe2-WSe2 films as electrodes and a channel, we fabricated the field-effect Time (s) transistor (FET) devices based on 2D-2D vdW metal semiconductor heterojunctions (HJs) and systematically studied their ultraviolet (UV) wavelength-dependent electrical and photoresponse properties. Upon the exposure to UV light with a wavelength of 365 nm, the NbSe2-WSe2, vdW HJFET devices exhibited threshold voltage shift toward positive gate bias direction, a current increase, and a nonlinear photocurrent increase upon applying a gate bias due to the contribution of the photogenerated hole current. In contrast, for the 254 nm UV irradiated FET devices, the drain current was decreased dramatically and the threshold voltage was negatively shifted. The time resolved photoresponse properties showed that the device current after turning off the 254 nm UVlight was completely and much more rapidly recovered compared with the case of the persistent photocurrent after turning off the 365 nm UV-light. Interestingly, we found that the wettability of the WSe2 surface was changed with increasing irradiation time only after 254 nm UV irradiation. The measured wetting behavior on the WSe2 surface provided direct evidence that the experimentally observed UV-wavelength-dependent phenomena was attributed to the UV-induced dissociative adsorption of oxygen and water molecules, leading to the modulation of charge trap states on the photogenerated and intrinsic carriers in the p-type WSe2 channel. This study will help provide an understanding of the influence of environmental and electrical measurement conditions on the electrical and optical properties of 2D-2D vdW HJ devices for a variety of device applications through the stacking of 2D heterostructures.
机译:原子上薄的二维(2D)范德瓦尔斯(VDW)异质结构是堆叠光电器件应用的非常重要的研究问题之一。在本研究中,使用转移和堆叠的Nbse2-WSE2薄膜作为电极和通道,我们制造了基于2D-2D VDW金属半导体异质结(HJ)的场效应时间晶体管(FET)器件,并系统地研究其紫外(UV)波长依赖性电气和光响应性。在暴露于波长365nm的UV光时,Nbse2-WSE2,VDW HJFET器件在施加栅极偏压时显示出朝向正栅极偏置方向的阈值电压移位,电流增加和非线性光电流增加光生孔电流。相反,对于254nm UV照射的FET器件,漏极电流显着降低,阈值电压负偏移。分辨的光响应性的时间显示,与关闭365nm uv光之后的持续光电流的情况相比,将254nm越灯在关闭254nm uvlight之后的装置电流。有趣的是,我们发现WSE2表面的润湿性随着254 nm紫外线照射而增加的照射时间而变化。 WSE2表面上的测量润湿行为提供了直接证据,即通过实验观察到的UV波长依赖性现象归因于UV诱导的氧和水分子的解离吸附,导致电荷捕集状态对光生和内在载体的调节在p型WSE2频道中。本研究将有助于通过堆叠2D异质结构来帮助了解环境和电气测量条件对2D-2D VDW HJ器件的电气和光学性能的影响。

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