首页> 外文期刊>ACS applied materials & interfaces >Bifunctional Hybrid a-SiOx(Mo) Layer for Hole-Selective and Interface Passivation of Highly Efficient MoOx/a-SiOx(Mo)/n-Si Heterojunction Photovoltaic Device
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Bifunctional Hybrid a-SiOx(Mo) Layer for Hole-Selective and Interface Passivation of Highly Efficient MoOx/a-SiOx(Mo)/n-Si Heterojunction Photovoltaic Device

机译:用于空穴选择性和界面钝化的双官能混合A-SiOx(Mo)层高效MOOX / A-SiOx(MO)/ N-Si异质结光伏器件

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摘要

The promising n-Si-based solar cell is constructed for the purpose of realizing hole- and electron selective passivating contact, using a textured front indium tin oxide/MoOx structure and a planar rear a-SiOx/poly(Si(n(+))) structure severally. The simple MoOx/n-Si heterojunction device obtains an efficiency of 16.7%. It is found that the accompanying ternary hybrid SiOx(Mo) interlayer (3.5-4.0 nm) is formed at the MoOx/n-Si boundary zone without preoxidation and is of amorphous structure, which is determined by a high-resolution transmission electron microscope with energy-dispersive X-ray spectroscopy mapping. The creation of lower-oxidation states in MoOx film indicates that the gradient distribution of SiOx with Mo element occurs within the interlayer, acting as a passivation of silicon substrate, which is revealed by X-ray photoelectron spectroscopy with depth etching. Specifically, calculations by density functional theory manifest that there are two half-filled levels (localized states) and three unoccupied levels (extended states) relating to Mo component in the ternary hybrid a-SiOx(Mo) interlayer, which play the roles of defect-assisted tunneling and direct tunneling for photogenerated holes, respectively. The transport process of photogenerated holes in the MoOx/n-Si heterojunction device is well-described by the tunnel-recombination model. Meanwhile, the a-SiOx/poly(Si(n(+))) has been assembled on the rear of the device for direct tunneling of photoinduced electrons and blocking photoinduced holes.
机译:有前途的N-Si基太阳能电池是为了实现孔和电子选择性钝化接触的目的,使用纹理的前铟锡/ MOOX结构和平面后A-SiOx / Poly(Si(n(+) ))分别结构。简单的MOOX / N-SI异质结装置获得16.7%的效率。发现伴随的三元杂交SiOx(Mo)中间层(3.5-4.0nm)形成在Moox / n-Si边界区,而不预先氧化并且是由高分辨率透射电子显微镜确定的非晶结构能量分散X射线光谱映射。在MOOX膜中产生较低氧化状态表明,用MO元素的SiOx梯度分布发生在中间层内,作为硅衬底的钝化,其被X射线光电子谱与深度蚀刻透露。具体而言,通过密度函数理论的计算表明,有两个半填充的水平(本地化状态)和三个未占用的级别(扩展状态)与三元杂交A-SiOx(Mo)中间层中的Mo组件相关,其发挥了缺陷的作用 - 分别为光生孔的隧道和直接隧道隧道。 MOOX / N-Si异质结装置中光发生孔的运输过程由隧道重组模型很好地描述。同时,A-SiOx / Poly(Si(+))已经组装在装置的后部,用于直接隧穿的光导电并阻挡光致孔。

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