机译:压电型厚度依赖性进化,条带90度域(101)的铁电PBTIO3薄膜
Chinese Acad Sci Inst Met Res Shenyang Natl Lab Mat Sci Wenhua Rd 72 Shenyang 110016 Liaoning Peoples R China;
Chinese Acad Sci Inst Met Res Shenyang Natl Lab Mat Sci Wenhua Rd 72 Shenyang 110016 Liaoning Peoples R China;
Nankai Univ Sch Phys Weijin Rd 94 Tianjin 300071 Peoples R China;
Chinese Acad Sci Inst Met Res Shenyang Natl Lab Mat Sci Wenhua Rd 72 Shenyang 110016 Liaoning Peoples R China;
Chinese Acad Sci Inst Met Res Shenyang Natl Lab Mat Sci Wenhua Rd 72 Shenyang 110016 Liaoning Peoples R China;
Chinese Acad Sci Inst Met Res Shenyang Natl Lab Mat Sci Wenhua Rd 72 Shenyang 110016 Liaoning Peoples R China;
Chinese Acad Sci Inst Met Res Shenyang Natl Lab Mat Sci Wenhua Rd 72 Shenyang 110016 Liaoning Peoples R China;
Chinese Acad Sci Inst Met Res Shenyang Natl Lab Mat Sci Wenhua Rd 72 Shenyang 110016 Liaoning Peoples R China;
ferroelectric thin films; PbTiO3; stripe 90 degrees domain; piezoresponse; TEM;
机译:压电型厚度依赖性进化,条带90度域(101)的铁电PBTIO3薄膜
机译:在PBTIO3铁电薄膜中,在头部到头和尾尾180度域壁上的二维电子和空穴气体的第一原理研究
机译:PbTiO3薄膜的90°和180°铁电畴结构的衍射对比分析
机译:通过使用压电响应力显微镜获得的PBZR1-Xtixo3薄膜铁电域的光导效应
机译:利用压电响应力显微镜对铁电薄膜的开关行为进行纳米研究。
机译:PbTiO3薄膜的90°和180°铁电畴结构的衍射对比分析
机译:BiFeO3薄膜中的180度铁电条纹纳米域
机译:铁电90(度)域形成与化学制备的pb(Zr,Ti)O(sub 3)薄膜电性能的关系