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Diffraction contrast analysis of 90° and 180° ferroelectric domain structures of PbTiO3 thin films

机译:PbTiO3薄膜的90°和180°铁电畴结构的衍射对比分析

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The ferroelectric domain structure of a PbTiO3 thin film on (100) SrTiO3 has been investigated by transmission electron microscopy (TEM). Two types of a-domain were found: one extended through the film to the surface and another comprised small a-domains confined within the film. Dark-field TEM (DFTEM) observation revealed that 180° domains formed near the substrate and stopped their growth 100?nm away from the substrate. The DFTEM observation also revealed that 90° domain boundaries had head-to-tail structures. To confirm the polarization direction obtained by experiments, diffracted intensities under a two-beam condition were simulated using the extended Darwin–Howie–Whelan equations. On the basis of the obtained results, a ferroelectric domain structure model of PbTiO3 thin films on SrTiO3 is proposed.
机译:通过透射电子显微镜(TEM)研究了(100)SrTiO 3 上的PbTiO 3 薄膜的铁电畴结构。发现了两种类型的α-畴:一种穿过膜延伸到表面,另一种包括限定在膜内的小的α-畴。暗场TEM(DFTEM)观察表明,在衬底附近形成了180°畴,并在距衬底100?nm处停止了它们的生长。 DFTEM观察还揭示了90°域边界具有头尾结构。为了确认通过实验获得的偏振方向,使用扩展的达尔文-豪伊-惠兰方程对两束条件下的衍射强度进行了模拟。在此基础上,提出了SrTiO 3 上PbTiO 3 薄膜的铁电畴结构模型。

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