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Flexible Memristive Devices Based on InP/ZnSe/ZnS Core-Multishell Quantum Dot Nanocomposites

机译:基于INP / ZNSE / ZnS核心多机器量子点纳米复合材料的灵活的忆故器件

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摘要

The effects of the ZnS shell layer on the memory performances of flexible memristive devices based on quantum dots (QDs) with an InP/ZnSe/ZnS core-multishell structure embedded in a poly(methylmethacrylate) layer were investigated. The on/off ratios of the devices based on QDs with an InP/ZnSe core-shell structure and with an InP/ZnSe/ZnS core-multishell structure were approximately 4.2 X 10(2) and 8.5 X 10(3), respectively, indicative of enhanced charge storage capability in the latter. After bending, the memory characteristics of the memristive devices based on QDs with the InP/ZnSe/ZnS structure were similar to those before bending. In addition, those devices maintained the same on/off ratios for retention time of 1 X 10(4) s, and the number of endurance cycles was above 1 X 10(2). The reset voltages ranged from -2.3 to -3.1 V, and the set voltages ranged from 1.3 to 2.1 V, indicative of reliable electrical characteristics. Furthermore, the possible operating mechanisms of the devices are presented on the basis of the electron trapping and release mode.
机译:研究了ZnS壳层对基于嵌入聚(甲基丙烯酸甲酯)层中的量子点(QDS)基于量子点(QDS)的柔性膜装置的存储性能的影响。基于带有InP / ZnSE核心壳结构的QDS的器件的ON /截止比和INP / ZNSE / ZNS核心 - MultiShell结构分别为约4.2×10(2)和8.5×10(3),表示后者的增强电荷存储能力。在弯曲之后,基于QDS与INP / ZNSE / ZNS结构的存储器的存储器特性类似于弯曲之前的QDS。另外,这些装置保持相同的接通/关差,用于保留时间为1×10(4)s,耐久性循环的数量高于1×10(2)。复位电压范围为-2.3至-3.1V,设定电压范围为1.3至2.1 V,表示可靠的电气特性。此外,基于电子捕获和释放模式呈现设备的可能操作机制。

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