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首页> 外文期刊>CERAMICS INTERNATIONAL >Electro and photon double-driven non-volatile and non-destructive readout memory in Pt/Bi0.9Eu0.1FeO3/Nb:SrTiO3 heterostructures
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Electro and photon double-driven non-volatile and non-destructive readout memory in Pt/Bi0.9Eu0.1FeO3/Nb:SrTiO3 heterostructures

机译:Pt / Bi0.9eu0.1fe3 / Nb:Srtio3异质结构中的电气和光子双驱非挥发性和非破坏性读数内存

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摘要

Ferroelectric resistive switching has recently attracted considerable attention as a promising candidate for next-generation non-volatile memory. In this work, we report an electro and photon double-driven bipolar resistive switching behavior in Pt /Bi0.9Eu0.1FeO3 (BEFO) /Nb-doped SrTiO3 (NSTO) heterostructures prepared via pulsed laser deposition. In addition to the polarization-based control of the resistive memory, a switchable photovoltaic effect is observed that can be used to detect the polarization direction non-destructively. Significantly, the electric field-modulated interfacial barrier can be further affected by photon-generated carriers. This phenomenon is attributed to the barrier modulation in the Pt /BEFO and BEFO/NSTO interfaces by electric field and photon excitation. These results indicate the feasibility of non-volatile and non-destructive readout from ferroelectric memory.
机译:铁电阻转换最近引起了相当大的关注,作为下一代非易失性记忆的有希望的候选者。 在这项工作中,我们在Pt /bi0.9eu0.1feO 3(Befo)/ Nb掺杂的Srtio3(Nsto)异质结构中报告了在Pt /bi0.9eu0.1feO3(Befo)/ Nb掺杂的SrtoIO3(NSTO)异质结构中的电极和光子双驱动双极电阻切换行为。 除了基于偏振的电阻存储器的控制之外,观察到可切换的光伏效果,其可用于检测偏振方向的无损性。 显着地,电场调制的界面屏障可以进一步受到光子产生的载体的影响。 这种现象归因于电场和光子激发的PT / BEFO和BEFO / NSTO界面中的阻隔调制。 这些结果表明了来自铁电记忆的非易失性和非破坏性读数的可行性。

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