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首页> 外文期刊>Analog Integrated Circuits and Signal Processing >Effect of Electromagnetic Interference (EMI) on the DC Shift, Harmonic and Intermodulation Performance of Diode-Connected NMOSFET
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Effect of Electromagnetic Interference (EMI) on the DC Shift, Harmonic and Intermodulation Performance of Diode-Connected NMOSFET

机译:电磁干扰(EMI)对连接二极管的NMOSFET的直流偏移,谐波和互调性能的影响

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摘要

In this paper a new approximation is presented for the nonlinear relationship between the gate-to-source voltage and the current of a diode-connected NMOSFET. Using this expression closed-form expressions are obtained for the DC and the amplitudes of the fundamental, second-and third-harmonic and intermodulation components of the gate-to-source voltage resulting from exciting the diode-connected NMOSFET by a DC biasing current plus a superimposed multisinusoidal EMI. Comparison between calculated and simulated results is included.
机译:本文针对栅源电压与二极管连接的NMOSFET的电流之间的非线性关系提出了新的近似值。使用该表达式,可以获得闭合形式的表达式,以表示直流以及栅极到源极电压的基波,二次谐波和三次谐波以及互调分量的幅度,这些幅度是通过直流偏置电流加上叠加的多正弦EMI。计算结果和模拟结果之间的比较也包括在内。

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