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首页> 外文期刊>材料の科学と工学 >Integral Formation of Circuit and Bump by Plating Process without Chemical Mechanical Polishing (CMP)
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Integral Formation of Circuit and Bump by Plating Process without Chemical Mechanical Polishing (CMP)

机译:电路整体形成,通过电镀工艺形成无化学机械抛光(CMP)

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摘要

In order to form a bump on an existing circuit, after forming a plating resist having an open portion that would become a bump on the circuit, plating is performed with a thickness equal to or greater than the thickness of the resist to form a mushroom-shaped bump. These mushroom-shaped bumps are polished by CMP, whereby it is possible to form bumps having a uniform height and a flat top. However, this kind of process is complicated and advanced techniques are required. Furthermore, as circuits and bumps are become more miniaturized, it is also difficult to achieve the necessary adhesion strength between the circuit and the bumps as well as the circuit and the materials. By using the formation method that we examined, we were able to form circuit-integrated bumps of uniform height and flat top without using CMP.
机译:为了在现有电路上形成凸块,在形成具有将成为电路上的凸块的开口部分的镀焊件之后,镀层,厚度等于或大于抗蚀剂的厚度以形成蘑菇 - 凸起。 这些蘑菇形凸块由CMP抛光,从而可以形成具有均匀高度和平顶的凸块。 但是,这种过程是复杂的,并且需要先进的技术。 此外,随着电路和凸块变得更加小型化,在电路和凸块之间以及电路和材料方面也难以实现必要的粘合强度。 通过使用我们检查的形成方法,我们能够在不使用CMP的情况下形成均匀高度和平顶的电路集成凸块。

著录项

  • 来源
    《材料の科学と工学》 |2017年第6期|共6页
  • 作者单位

    College of Engineering Kan to Gakuin University 1-50-1;

    Mutsuurahigasi Kanazawa Yokohama Kanagawa 236-8501 Japan;

    Kan to Gakuin University Materials and Surface Engineering Research Institute 1162-2 Ogikubo Odawara Kanagawa 236-8501 Japan;

    Kan to Gakuin University Materials and Surface Engineering Research Institute 1162-2 Ogikubo Odawara Kanagawa 236-8501 Japan;

    College of Engineering Kan to Gakuin University 1-50-1;

    Mutsuurahigasi Kanazawa Yokohama Kanagawa 236-8501 Japan;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学;
  • 关键词

    Bump; Electroplating; Photolithography;

    机译:凹凸;电镀;光刻;

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